Zebrev Gennadiy I. Course Schedule

  1. Autumn semester of 2018/2019 academic year
  2. Teaching Staff Schedule
  3. Zebrev G.I.
PDF ICS

Monday

09:20 — 11:00
dep.27
Sem
Scientific Research Work S14-403 , S14-404 Bakerenkov A.S., Belyakov V.V., Bocharov Y.I., Butuzov V.A., Chubunov P.A., Gorbunov M.S., Lebedev A.A., Pershenkov V.S., Podlepetskiy B.I., Popov V.D., Samotaev N.N., Shagurin I.I., Shaltaeva Y.R., Veselov D.S., Voronov Y.A., Zebrev G.I.

Tuesday

10:15 — 11:50
D-311
Lab
Reliability and Radiation Resistance of Integrated Circuits S14-403 Zebrev G.I.
D-311
Lab
Reliability and Radiation Resistance of Integrated Circuits S14-404 Zebrev G.I.

Thursday

10:15 — 11:50
D-303
Sem
Reliability and Radiation Resistance of Integrated Circuits S14-404 Zebrev G.I.
11:55 — 13:30
D-311
Lec
Reliability and Radiation Resistance of Integrated Circuits S14-403 , S14-404 Zebrev G.I.
14:30 — 16:05
D-311
Sem
Reliability and Radiation Resistance of Integrated Circuits S14-403 Zebrev G.I.
17:55 — 19:30
dep.27
Sem
Scientific Research Work S15-402 Bakerenkov A.S., Belyakov V.V., Bocharov Y.I., Butuzov V.A., Lebedev A.A., Pershenkov V.S., Podlepetskiy B.I., Popov V.D., Samotaev N.N., Shagurin I.I., Shaltaeva Y.R., Veselov D.S., Voronov Y.A., Zebrev G.I.

Friday

08:30 — 10:05
D-408
Sem
Reliability and Radiation Resistance of Microelectronic Devices and Systems M18-403 Zebrev G.I.
10:15 — 11:50
D-408
Lec
Reliability and Radiation Resistance of Microelectronic Devices and Systems M18-403 Zebrev G.I.
12:45 — 14:20
dep.27
Sem
Scientific Research Work S14-403 , S14-404 Bakerenkov A.S., Belyakov V.V., Bocharov Y.I., Butuzov V.A., Chubunov P.A., Gorbunov M.S., Lebedev A.A., Pershenkov V.S., Podlepetskiy B.I., Popov V.D., Samotaev N.N., Shagurin I.I., Shaltaeva Y.R., Veselov D.S., Voronov Y.A., Zebrev G.I.

Saturday

16:15 — 17:50
dep.27
Sem
Scientific Research Work S15-402 Bakerenkov A.S., Belyakov V.V., Bocharov Y.I., Butuzov V.A., Lebedev A.A., Pershenkov V.S., Podlepetskiy B.I., Popov V.D., Samotaev N.N., Shagurin I.I., Shaltaeva Y.R., Veselov D.S., Voronov Y.A., Zebrev G.I.