Exams for group S15-402

  1. НИЯУ МИФИ
  2. Autumn semester of 2019/2020 academic year
  3. Course Schedule
  4. S15-402
  5. Exams
Printable version
Mon, 23 Dec, 12:00 — 15:00
D-405
Att
Sensors Based on Micro- and Nanotechnologies Podlepetskiy B.I.
Mon, 23 Dec, 15:00 — 18:00
B-213
Test
Life Safety Mogilenets N.N.
Tue, 24 Dec, 09:00 — 12:00
dep.27
Test
Scientific Research Work Shaltaeva Y.R.
Tue, 24 Dec, 12:00 — 15:00
D-311
Test
Elect
Microelectronic Radio Devices Bocharov Y.I.
Tue, 24 Dec, 12:00 — 15:00
D-303
Test
Elect
Principles of functional and microwave microelectronics Patrikeev L.N.
Tue, 24 Dec, 15:00 — 18:00
B-216
Test
Elect
Local Networks for Personal Computers Lapshinskiy V.A.
Wed, 25 Dec, 12:00 — 15:00
D-410
Att
Principles of Optoelectronics Voronov Y.A.
Wed, 25 Dec, 15:00 — 18:00
D-303
Att
Software Support of Modern Microprocessors and Microcontrollers Subgroup 1 Shaltaeva Y.R.
Wed, 25 Dec, 15:00 — 18:00
D-311
Att
Software Support of Modern Microprocessors and Microcontrollers Subgroup 2 Bocharov Y.I.
Thu, 26 Dec, 12:00 — 15:00
D-311
Att
Reliability and Radiation Resistance of Integrated Circuits Zebrev G.I.
Thu, 26 Dec, 15:00 — 18:00
K-1117
Test
Elect
Quantum Radiophysics Larkin A.I.
Fri, 27 Dec, 09:00 — 12:00
A-100
Test
Management and Marketing Silenko A.N.
Sat, 28 Dec, 12:00 — 15:00
D-311
Test
Information Measurement Systems Belyakov V.V.
Mon, 13 Jan, 09:00 — 13:00
K-415
Exam
Sensors Based on Micro- and Nanotechnologies Podlepetskiy B.I.
Fri, 17 Jan, 09:00 — 13:00
D-303
Exam
Software Support of Modern Microprocessors and Microcontrollers Osipenko P.N.
Tue, 21 Jan, 09:00 — 13:00
D-311
Exam
Principles of Optoelectronics Voronov Y.A.
Mon, 27 Jan, 09:00 — 13:00
D-311
Exam
Reliability and Radiation Resistance of Integrated Circuits Zebrev G.I.