K-1009. Exam Schedule Building K

Fri, 22 Dec, 10:15 — 11:50
Att
Analog Integrated Devices for Measuring Systems M23-210 Maslennikov V.V.
Fri, 22 Dec, 12:45 — 14:20
Parameter Measuring in Speedy Processes M23-210 Reshetov V.N.
Thu, 28 Dec, 15:20 — 17:00
Measuring of Electromagnetic Process Parameters M23-210 Reshetov V.N.
Wed, 24 Jan, 09:00 — 13:00
Exam
Analog Integrated Devices for Measuring Systems M23-210 Reshetov V.N.