D-408. Exam Schedule Building D

  1. Autumn semester of 2017/2018 academic year
  2. Room Assignment
  3. D-408
  4. Exam Schedule
Printable version
Mon, 25 Dec, 09:00 — 12:00
Test
Design of Integrated Circuits and Systems-on-Chip (SOC) M16-406, M17-403 Bakerenkov A.S.
Mon, 25 Dec, 12:45 — 14:20
Att
Reliability and Radiation Resistance of Microelectronic Devices and Systems M16-406, M17-403 Zebrev G.I.
Tue, 09 Jan, 09:00 — 13:00
Exam
Reliability and Radiation Resistance of Microelectronic Devices and Systems M16-406, M17-403 Zebrev G.I.
Mon, 22 Jan, 09:00 — 13:00
Exam
Design of Integrated Circuits and Systems-on-Chip (SOC) M16-406 Bakerenkov A.S.