Showing conferences for last 3 years
- Сентябрь 2021
ICMNE, 2021
Report:
A universal approach to FET compact modeling: Case study for MESFETs and OFETs
- Май 2021
4th International Conference on Radiation Effects of Electronic Devices, Xi'an International Conference Center, Xi'an, China May 26-29, 2021
Report:
Single Event Concepts and Characterization
- Сентябрь 2021
MIEL, 2021
Report:
An Accurate Analytical Modeling of Contact Resistances in MOSFETs
- Сентябрь 2021
Radiation and its Effects on Components and Systems, 3th – 17th September 2021 Hotel Savoyen Vienna – Austria
Report:
Investigation and Simulation of SEL Cross Sections at Different Temperatures