Sogoyan Armen V.

Degree: Candidate of Sciences (PhD) in Technology

Department of Electronics

Центр экстремальной прикладной электроники института нанотехнологий в электронике, спинтронике и фотонике НИЯУ МИФИ

Department of Solid-State Physics and Nanosystems

english

Works at MEPhI since 1994

Work Experience: 31 years

1992 — National Research Nuclear University MEPhI

1. Electrical Engineering, Electronics and Circuit Design (Electronics)

2. Electronic Sensors

3. Physics of semiconductor and digital devices

h-index (Web of Science)

h-index (Scopus)

h-index (РИНЦ)

Showing publications for last 3 years

Article
Web of Science & Scopus
Limitations of Methods for Evaluating the Hardness of Microelectronic Devices to Single Event Effects on Ion Accelerators // Russian Microelectronics, 2022 Vol. 51, No. 1, Q4 pp. 16-23 doi
Article
MEPhI publication
SOME ASPECTS OF IC RADIATION HARDNESS EVALUATION WHEN EXPOSED TO NEUTRONS // Bezopasnost informacionnyh tehnology, 2021 Vol. Т. 28, No. N 2 pp. 34-43 doi

Showing conferences for last 3 years

Conferences not found

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