Belyakov Vladimir V. Exam Schedule

Mon, 23 Dec, 10:15 — 11:50
Att
Information and measurement systems in microelectronics S20-401, S20-402
Mon, 13 Jan, 09:00 — 13:00
Exam
Design of Integrated Circuits and Systems-on-Chip (SOC) M23-423
Wed, 15 Jan, 09:00 — 13:00
Exam
Information and measurement systems in microelectronics S20-401, S20-402