Exams for group M16-403

  1. НИЯУ МИФИ
  2. Spring semester of 2016/2017 academic year
  3. Course Schedule
  4. M16-403
  5. Exams
Printable version
Tue, 02 May, 14:30 — 17:00
dep.67
Att
Practical Training (Research Work) Iridzava A.
Wed, 03 May, 10:15 — 11:50
K-206
Att
Elect
Experimental Methods of Condensed Matter Physics Katin K.P. , Maslov M.M.
Wed, 03 May, 11:55 — 13:30
dep.67
Att
Devices of Micro-and Nanoelectronics: Physics and Technology Antonenko S.V.
Wed, 03 May, 14:30 — 16:05
33-302
Test
Physics of Nanosystems Kulbachinskiy V.A.
Thu, 04 May, 10:15 — 11:50
D-303
Att
Elect
Design of Integrated Circuits and Systems-on-Chip (SOC) Shaltaeva Y.R. , Bakerenkov A.S.
Thu, 04 May, 13:00 — 14:20
7-1
Test
Introduction to Measurements in Solid-state Nanoelectronics Kargin N.I.
Fri, 05 May, 10:15 — 11:50
407
Test
Principles of Information Security Malyuk A.A.
Thu, 18 May, 09:00 — 13:00
D-303
Exam
Elect
Design of Integrated Circuits and Systems-on-Chip (SOC) Bakerenkov A.S. , Shaltaeva Y.R.
Thu, 18 May, 09:00 — 13:00
dep.67
Exam
Elect
Experimental Methods of Condensed Matter Physics Maslov M.M.
Mon, 22 May, 09:00 — 13:00
33-304
Exam
Devices of Micro-and Nanoelectronics: Physics and Technology Kargin N.I.
Fri, 26 May, 09:00 — 13:00
dep.67
Exam
Practical Training (Research Work) Iridzava A.