Exams for group M15-405

  1. НИЯУ МИФИ
  2. Autumn semester of 2016/2017 academic year
  3. Course Schedule
  4. M15-405
  5. Exams
Printable version
Thu, 22 Dec, 12:00 — 15:00
D-410
Att
Reliability and Radiation Resistance of Microelectronic Devices and Systems Zebrev G.I.
Thu, 22 Dec, 15:00 — 18:00
D-303
Att
Elect
Principles of Radiation Technology Butin V.I.
Thu, 22 Dec, 15:00 — 18:00
D-418
Att
Elect
Telecommunication Systems and Networks Shaltaeva Y.R.
Fri, 23 Dec, 09:00 — 12:00
A-100
Test
Marketing and Management Rumyantsev V.P. , Prohorov I.V. , Stepanova E.B.
Fri, 23 Dec, 12:00 — 15:00
D-408
Att
Elect
Design of Integrated Circuits and Systems-on-Chip (SOC) Bakerenkov A.S. , Shaltaeva Y.R.
Fri, 23 Dec, 15:00 — 18:00
405
Test
Principles of Information Security Ozhered I.V. , Malyuk A.A.
Tue, 27 Dec, 12:00 — 15:00
404
Test
Principles of Nuclear Technologies Apse V.A.
Tue, 27 Dec, 15:00 — 18:00
A-100
Test
Legal and International Aspects of Nonproliferation and Nuclear Materials Safety. Kulikov E.G.
Wed, 28 Dec, 09:00 — 12:00
D-408
Test
Modern Micro and Nanotechnologies Veselov D.S.
Wed, 28 Dec, 12:00 — 15:00
dep.27
Test
Academic Practice (Research) Samotaev N.N.
Wed, 11 Jan, 09:00 — 13:00
D-410
Exam
Reliability and Radiation Resistance of Microelectronic Devices and Systems Zebrev G.I.
Tue, 17 Jan, 09:00 — 13:00
D-408
Exam
Elect
Design of Integrated Circuits and Systems-on-Chip (SOC) Bakerenkov A.S. , Shaltaeva Y.R.
Tue, 24 Jan, 09:00 — 13:00
D-303
Exam
Elect
Principles of Radiation Technology Butin V.I.
Tue, 24 Jan, 09:00 — 13:00
D-418
Exam
Elect
Telecommunication Systems and Networks Shaltaeva Y.R.