D-408. Exam Schedule Building D

Mon, 24 Dec, 14:30 — 16:05
Test
Interaction of RF Electromagnetic Radiation with Semiconductor Electronics Materials (Physics Principals) M18-416 Shurenkov V.V.
Wed, 26 Dec, 11:05 — 12:40
Att
Reliability and Radiation Resistance of Microelectronic Devices and Systems M17-416 Zebrev G.I.
Fri, 28 Dec, 08:30 — 10:05
Att
Reliability and Radiation Resistance of Microelectronic Devices and Systems M18-403 Zebrev G.I.
Mon, 14 Jan, 09:00 — 13:00
Exam
Reliability and Radiation Resistance of Microelectronic Devices and Systems M17-416 Zebrev G.I.
Fri, 25 Jan, 09:00 — 13:00
Exam
Reliability and Radiation Resistance of Microelectronic Devices and Systems M18-403 Zebrev G.I.