D-311. Exam Schedule Building D

  1. Spring semester of 2017/2018 academic year
  2. Room Assignment
  3. D-311
  4. Exam Schedule
Printable version
Mon, 23 Apr, 11:05 — 12:40
Test
Materials Science in Micro and Nanoelectronics S13-403, S13-404 Samotaev N.N.
Mon, 23 Apr, 11:55 — 13:30
Test
Materials Science in Micro and Nanoelectronics S13-401, S13-402 Samotaev N.N.
Tue, 24 Apr, 10:15 — 11:50
Test
Materials Science in Micro and Nanoelectronics S13-601 Samotaev N.N.
Tue, 24 Apr, 14:30 — 16:05
Test
Nanoelectronic Technology S13-403, S13-404 Veselov D.S.
Thu, 26 Apr, 10:15 — 11:50
Test
Design of Radiation-Hard Fault-Tolerant Digital CMOS VLSI (in English) S13-403, S13-404 Gorbunov M.S.
Fri, 27 Apr, 10:15 — 11:50
Att
Electromagnetic Compatibility (Emc) S13-403, S13-404 Shurenkov V.V.
Tue, 22 May, 15:00 — 18:00
Att
Microelectronics. Physical Principles S15-402 Nikiforova M.Y.
Tue, 22 May, 18:00 — 22:00
Att
Sensors Based on Micro- and Nanotechnologies B15-V77 Podlepetskiy B.I.
Wed, 23 May, 09:00 — 12:00
Test
Design of Integrated Circuits S14-403 Popov V.D.
Wed, 23 May, 18:45 — 20:20
Test
Digital Signal Processing M17-406, M17-416 Bocharov Y.I.
Thu, 24 May, 18:45 — 20:20
Att
Physics of Microelectronic Structures M17-406, M17-416 Pershenkov V.S.
Thu, 24 May, 20:25 — 22:00
Test
Principles of Radiation Technology M17-406, M17-416 Pershenkov V.S.
Fri, 25 May, 18:00 — 22:00
Test
Electrical Engineering, Electronics and Circuitry B16-V77 Lebedev A.A.
Fri, 08 Jun, 18:00 — 22:00
Exam
Sensors Based on Micro- and Nanotechnologies B15-V77 Podlepetskiy B.I.
Thu, 14 Jun, 09:00 — 13:00
Exam
Physics of Microelectronic Structures M17-406, M17-416 Pershenkov V.S.