Personalities of MEPhI
NRNU MEPhI National Research Nuclear University MEPhI
  1. Faculty and Staff
  2. Yanenko A.V.
Yanenko A.V.

Yanenko Andrey V.

Degree: Candidate of Sciences (PhD) in Technology

Associate Professor

Department of Electronics

Leading Research Fellow

Центр экстремальной прикладной электроники института нанотехнологий в электронике, спинтронике и фотонике НИЯУ МИФИ
  • В-303-3
  • 6943
Send message Autumn 2024. Schedule

Languages

english
russian
Works at MEPhI since 1993
Work Experience: 26 years

Education

1993 — National Research Nuclear University MEPhI

Courses

1. Extreme Electronics
2. Methods of Radiation Research

Publication activity

4
h-index (Web of Science)
12
h-index (Scopus)
15
h-index (РИНЦ)

Showing publications for last 3 years

  1. Article
    Web of Science & Scopus
    Qualitative Risk Assessment in the Application of Circuit-based Protection Against SEL in Space Electronics // Moscow Workshop on Electronic and Networking Technologies, MWENT 2022 - Proceedings, 2022 TOP10 doi
  2. Article
    Web of Science & Scopus
    The Problems of Microassemblies Constructional Adaptation for SEE Heavy Ion Testing // Moscow Workshop on Electronic and Networking Technologies, MWENT 2022 - Proceedings, 2022 TOP10 doi
  3. Article The Problems of Microassemblies Constructional Adaptation for SEE Heavy Ion Testing // Materials of Moscow Workshop on Electronic and Networking Technologies (MWENT-2022) , IEEE, 2022
  4. Article RISKS OF SINGLE EVENT LATCHUP CIRCUIT-BASED PROTECTION IN SPACE ELECTRONICS // 2022 Vol. 1, No. 5 pp. 18-21
  5. Article Qualitative Risk Assessment in the Application of Circuit-based Protection Against SEL in Space Electronics // Materials of Moscow Workshop on Electronic and Networking Technologies (MWENT-2022) , IEEE, 2022
  6. Article
    Web of Science & Scopus
    Limitations of Methods for Evaluating the Hardness of Microelectronic Devices to Single Event Effects on Ion Accelerators // Russian Microelectronics, 2022 Vol. 51, No. 1, Q4 pp. 16-23 doi
  7. Article
    Web of Science & Scopus
    Searching The Damaged Area on IC Chip Using Ionization Response Mapping // RADECS 2021 - European Conference on Radiation and its Effects on Components and Systems, 2021 TOP10 doi
  8. Article
    Web of Science & Scopus
    Investigation of Operating System Influence on Single Event Functional Interrupts Using Fault Injection and Hardware Error Detection in ARM Microcontroller // SIBCON 2021 - International Siberian Conference on Control and Communications, 2021 НЕТ doi
  9. Article
    Web of Science & Scopus
    Leakage Currents Automated Monitoring System for Memory ICs under Dose Exposure // SIBCON 2021 - International Siberian Conference on Control and Communications, 2021 НЕТ doi

Showing conferences for last 3 years

  1. Июнь 2022 Moscow Workshop on Electronic and Networking Technologies (MWENT-2022) Report: Qualitative Risk Assessment in the Application of Circuit-based Protection Against SEL in Space Electronics

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