BEGIN:VCALENDAR
VERSION:2.0
PRODID:icalendar-ruby
CALSCALE:GREGORIAN
METHOD:PUBLISH
BEGIN:VTIMEZONE
TZID:Europe/Moscow
BEGIN:STANDARD
DTSTART:19700101T000000
TZOFFSETFROM:+0300
TZOFFSETTO:+0300
TZNAME:MSK
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20260416T005620Z
UID:93d6533d-d412-4e69-827d-fd233e03a19d
DTSTART;TZID=Europe/Moscow:20250213T143000
DTEND;TZID=Europe/Moscow:20250213T160500
DESCRIPTION:Zhukov A.I. B23-506
LOCATION:D-405
SUMMARY:Subgroup 1
RRULE:FREQ=WEEKLY;UNTIL=20250522T160500;INTERVAL=2;WKST=MO
EXDATE:20250508T143000
END:VEVENT
BEGIN:VEVENT
DTSTAMP:20260416T005620Z
UID:bc36347c-127b-4c14-bf60-d8d5b6f4940e
DTSTART;TZID=Europe/Moscow:20250220T143000
DTEND;TZID=Europe/Moscow:20250220T160500
DESCRIPTION:Zhukov A.I. B23-506
LOCATION:D-405
SUMMARY:Subgroup 2
RRULE:FREQ=WEEKLY;UNTIL=20250515T160500;INTERVAL=2;WKST=MO
EXDATE:20250501T143000
END:VEVENT
BEGIN:VEVENT
DTSTAMP:20260416T005620Z
UID:3fad25aa-e4ec-4fca-b8ff-c20493b327a1
DTSTART;TZID=Europe/Moscow:20250213T161500
DTEND;TZID=Europe/Moscow:20250213T175000
DESCRIPTION:Zhukov A.I. B23-516
LOCATION:D-405
SUMMARY:Subgroup 2
RRULE:FREQ=WEEKLY;UNTIL=20250522T175000;INTERVAL=2;WKST=MO
EXDATE:20250508T161500
END:VEVENT
BEGIN:VEVENT
DTSTAMP:20260416T005620Z
UID:75e28eb1-cf0e-439d-b343-e2dbb802f531
DTSTART;TZID=Europe/Moscow:20250220T161500
DTEND;TZID=Europe/Moscow:20250220T175000
DESCRIPTION:Zhukov A.I. B23-516
LOCATION:D-405
SUMMARY:Subgroup 1
RRULE:FREQ=WEEKLY;UNTIL=20250515T175000;INTERVAL=2;WKST=MO
EXDATE:20250501T161500
END:VEVENT
BEGIN:VEVENT
DTSTAMP:20260416T005620Z
UID:c897a0b3-8297-4ad9-8b5d-d7ca0767300d
DTSTART;TZID=Europe/Moscow:20250225T143000
DTEND;TZID=Europe/Moscow:20250225T175000
DESCRIPTION:Zhukov A.I. M24-423
LOCATION:D-408
SUMMARY:Reliability and radiation resistance of integrated circuits
RRULE:FREQ=WEEKLY;UNTIL=20250429T175000;WKST=MO
END:VEVENT
BEGIN:VEVENT
DTSTAMP:20260416T005620Z
UID:473478dc-ab4e-40b5-9718-f2103f104a7f
DTSTART;TZID=Europe/Moscow:20250506T161500
DTEND;TZID=Europe/Moscow:20250506T175000
DESCRIPTION:Zhukov A.I. M24-423
LOCATION:D-408
SUMMARY:Reliability and radiation resistance of integrated circuits
END:VEVENT
END:VCALENDAR